PCE Instruments RT 2200 Roughness Tester

Model # RT 2200

The portable and easy-to-use profilometer with its large OLED display is particularly suitable for quick and precise measurements in the workshop or laboratory.
This roughness meter uses a DSP chip for control and data processing at high speed and with low energy consumption.
In addition, you have a large selection of measurement parameters for the roughness measuring device: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry (JIS), Rz (JIS), RP (ASME), Rpm (ASME ), Rv (ASME), R3z, R3zmax, Rz1max, Rmr (c), Rdc, Rmr.
The measurements are automatically stored in the internal memory of the roughness meter. The stored data can then be transferred to a PC via the micro-USB interface on the roughness measuring device and analyzed using the software.
It is also possible to have the data displayed on the OLED display of the roughness measuring device after a measurement. Even the wave course can be shown on the display of the roughness meter.
It often happens that the contact surface of the test piece is too small for a roughness measuring device to position the roughness measuring device appropriately for a measurement. For such cases, a positioning adapter is included with this roughness measuring device. Thus, the roughness measuring device also enables measurements on small samples.

Parameter	Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry(JIS),
	Rz(JIS), RP(ASME), Rpm(ASME), Rv(ASME),
	R3z, R3zmax, Rz1max, Rmr(c), Rdc, Rmr

Measuring range	Ra, Rq, Rc: 0.005 … 16 µm
	Rsm: 5 … 1000 µm
	Rsk: -1 … 1
	Rz, Rt, Rp, Rv, Rmax, Ry(JIS), Rz(JIS),RP(ASME),
	Rpm(ASME), Rv(ASME), R3z, R3zmax, Rz1max,
	Rdc: 0.02 … 200 µm Rmr(c), Rmr: 0 … 100 %

Probe tip radius	5 µm
Probe tip material	diamond, 90° angled
Max.recommended force	4 mN (0.4 gf)
with static measurement
Measuring principle	inductive
Radius of the longitudinal guide rail	45 mm
Standards	ANSIB46.1/ASMEB46.1 (DIN EN ISO 4287)
Maximum travel distance	15 mm
Cut off wavelength	0.25 mm / 0.8 mm / 2.5 mm
Scanning speed	0.135 mm/s at cutoff wavelength: 0.25 mm
	0.5 mm/s at cutoff wavelength: 0.8 mm
	1 mm/s at cut-off wavelength: 2.5 mm
	Return speed: 1 mm/s
Memory	20 measurement runs with all parameters
Measurement accuracy	<±10 %
Repeatability	<6 %
Display	OLED
Units	μm / μinch (switchable)
Interface	Micro USB
Power supply	rechargeable Li-ion battery