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    PCE Instruments RT 2200 Roughness Tester

    # RT 2200

    • Selection of 21 parameters
    • Fast and accurate measurement
    • 3 different cut-off wavelengths
    • Micro-USB interface for PC connection
    • Storage of 20 measurement curves
    • The portable and easy-to-use profilometer with its large OLED display is particularly suitable for quick and precise measurements in the workshop or laboratory.
    • This roughness meter uses a DSP chip for control and data processing at high speed and with low energy consumption.
    • In addition, you have a large selection of measurement parameters for the roughness measuring device: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry (JIS), Rz (JIS), RP (ASME), Rpm (ASME ), Rv (ASME), R3z, R3zmax, Rz1max, Rmr (c), Rdc, Rmr.
    • The measurements are automatically stored in the internal memory of the roughness meter. The stored data can then be transferred to a PC via the micro-USB interface on the roughness measuring device and analyzed using the software.
    • It is also possible to have the data displayed on the OLED display of the roughness measuring device after a measurement. Even the wave course can be shown on the display of the roughness meter.
    • It often happens that the contact surface of the test piece is too small for a roughness measuring device to position the roughness measuring device appropriately for a measurement. For such cases, a positioning adapter is included with this roughness measuring device. Thus, the roughness measuring device also enables measurements on small samples.
    ParameterRa, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry(JIS),
    Rz(JIS), RP(ASME), Rpm(ASME), Rv(ASME),
    R3z, R3zmax, Rz1max, Rmr(c), Rdc, Rmr
    Measuring rangeRa, Rq, Rc: 0.005 … 16 µm
    Rsm: 5 … 1000 µm
    Rsk: -1 … 1
    Rz, Rt, Rp, Rv, Rmax, Ry(JIS), Rz(JIS),RP(ASME),
    Rpm(ASME), Rv(ASME), R3z, R3zmax, Rz1max,
    Rdc: 0.02 … 200 µm Rmr(c), Rmr: 0 … 100 %
    Probe tip radius5 µm
    Probe tip materialdiamond, 90° angled
    Max.recommended force4 mN (0.4 gf)
    with static measurement
    Measuring principleinductive
    Radius of the longitudinal guide rail45 mm
    StandardsANSIB46.1/ASMEB46.1 (DIN EN ISO 4287)
    Maximum travel distance15 mm
    Cut off wavelength0.25 mm / 0.8 mm / 2.5 mm
    Scanning speed0.135 mm/s at cutoff wavelength: 0.25 mm
    0.5 mm/s at cutoff wavelength: 0.8 mm
    1 mm/s at cut-off wavelength: 2.5 mm
    Return speed: 1 mm/s
    Memory20 measurement runs with all parameters
    Measurement accuracy<±10 %
    Repeatability<6 %
    Unitsμm / μinch (switchable)
    InterfaceMicro USB
    Power supplyrechargeable Li-ion battery
    • 1 x Profilometer PCE-RT 2200
    • 1 x Microprobe
    • 1 x Protective cap for probe
    • 1 x Positioning device
    • 1 x Calibration plate
    • 1 x Roughness standard
    • 1 x USB cable
    • 1 x Charging adapter
    • 1 x Carrying case
    • 1 x Instruction manual

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